Reliability Wearout Mechanisms in Advanced CMOS Technologies

Name: Reliability Wearout Mechanisms in Advanced CMOS Technologies
Brand: John Wiley & Sons Inc
SKU: 2181195
Author: Alvin W. (IBM) Strong

Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Rolf-Peter (Infineon) Vollertsen, Spain) Jordi (Universitat Autonoma de Barcelona Sune, Giuseppe (IBM) La Rosa, Timothy D. (IBM) Sullivan, Stewart E. Rauch

John Wiley & Sons Inc

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or…

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