Functional Design Errors in Digital Circuits

Name: Functional Design Errors in Digital Circuits
Brand: Springer-Verlag New York Inc.
SKU: 2343724
Author: Igor L. Markov

Igor L. Markov, Kai-hui Chang, Valeria Bertacco

Springer-Verlag New York Inc.

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Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause…

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